Laboratory Overview
The High-Frequency Characterization Lab provides automated wafer-scale testing, large signal measurements, and full device characterization for VCSELs and edge-emitting lasers at data rates exceeding 50 Gb/s.
Led by Assoc. Prof. Georgiy Sapunov, the lab supports both internal research and external collaborations.
Open laboratory space
Automated wafer-scale characterization
Large signal measurement setup
International students at work